NFC Forum Conformance Solutions

NFC-Forum-Logo

The NFC Forum specifies international test standards for functional validation at the analog and protocol levels of phones, smart cards, devices and other systems implementing the NFC protocol in 13.56 Mhz contactless communications. These standards are the foundation for ensuring the reliability and interoperability of NFC systems and devices. The NFC Forum standard and derived testing solutions allow conformance assessment of:

  • End-user contactless devices (smart cards (PICC), tags, keyfobs, NFC handsets)
  • Packaged devices (inlays, modules)
  • Embedded integrated circuits (hardware chips, secure elements)
NFC-Test-Plaform

KEOLABS' NFC Forum Test Solutions are SCRIPTIS-based solutions that are available to users for "in house" evaluation of their products during development before engaging in a formal certification. Solutions for NFC Forum conformance testing include:

  • NFC Forum SNEP / LLCP Conformance Solution - SCRIPTIS test suite for validating conformance of devices and systems to the SNEP / LLCP standards for both polling and listening modes.
  • NFC Forum Digital Conformance Solution - SCRIPTIS test suite for validating conformance of devices and systems in polling and listening modes for NFC Forum digital protocol test cases.

Testing platform:
- ProxiLAB
- ProxiLAB PICC Probe+ interface board
- PICC probe1 and PCD Probe1
- KEOLABS' NFC Poller/Listener kit

  • NFC Forum Analog Conformance Solution for Poller/Listener - SCRIPTIS test suite for validating conformance of devices and systems in polling and listening modes for NFC Forum analog test cases.

Testing Platform

  • ProxiLAB
  • Complete NFC analog test bench
  • 3-axis automation platform (optional)

Additional Related Solutions

In addition to the NFC testing solutions, KEOLABS provides additional solutions for validation of the CLF and USIM components in the NFC mobile phone under related test standards. These include:

  • PICC Analog Test Solution
    (ICAO layers 1&2 / ISO/IEC10373-6 / 7)
  • PICC Digital Test Solution
    (ICAO layers 3&4 / ISO/IEC 10373-6 annex G / ECMA 362 / Felica / B' / ISO/IEC 10373-7)
  • PCD Analog Test Solution
    (ICAO layers 1&2 / ISO/IEC 10373-6)
  • PCD Digital Test Solution
    (ICAO layers 3&4 / ISO/IEC 10373-6 annex H / ECMA 362)
  • UICC SWP Test Solution
    (SHDLC) ETSI TS 102 694-2
    (HCI) ETSI TS 102 695-2
  • Contactless Front End SWP Test Solution
    (SHDLC) ETSI TS 102 694-1
    (HCI) ETSI TS 102 695-1